Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Augieri A., Piperno L., Masi A., Cialone M., Iebole M., Botti S., Bonfigli F., Savio L.
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Rizzo F., Augieri A., Armenio A.A., Martinelli A., Sotgiu G., Meledin A., Pinto V., Piperno L., Manca N., Cialone M., Iebole M.
Grasso G., Tumino A., Ferdeghini C., Hopkins S.C., Putti M., Vignolo M., Bernini C., Ballarino A., Tropeano M., Bovone G., Capra M., Loria F.
Ключевые слова: MgB2, wires, ex-situ process, fabrication, precursors, nanoscaled effects, powder processing, size effect, oxygen, composition, X-ray diffraction, microstructure, susceptibility, critical temperature, critical caracteristics, Jc/B curves, magnetization, pinning centers, pinning force, experimental results
Grasso G., Tumino A., Ferdeghini C., Hopkins S.C., Putti M., Vignolo M., Bernini C., Ballarino A., Tropeano M., Bovone G., Capra M., Loria F.
Ferdeghini C., Eisterer M., Vaglio R., Putti M., Bernini C., Calatroni S., Bellingeri E., Holleis S., Bernardi J., Leveratto A., Saba A., Himmerlich M., Henrist B., Fernandez-Pena S., Moros A.
Mancini A., Rufoloni A., Vannozzi A., Braccini V., Putti M., Manfrinetti P., Rizzo F., Augieri A., Silva E., Armenio A.A., Pinto V., Piperno L., Sylva G., Masi A., Prili S., Celentano E.S.
Ключевые слова: chalcogenide, FeSeTe, films, PLD process, fabrication, buffer layers, films epitaxial, chemical solution deposition, substrate single crystal, substrate sapphire, substrate SrTiO3, X-ray diffraction, microstructure, resistive transition, resistance, temperature dependence, critical caracteristics, Jc/B curves, pinning force
Malagoli A., Ferdeghini C., Mancini A., Vannozzi A., Celentano G., Braccini V., Putti M., Manfrinetti P., Pallecchi I., Bernini C., Bellingeri E., Leveratto A., Sylva G., Lisitskiy M., Manca N., Provino A.
Ключевые слова: chalcogenide, FeSeTe, coated conductors, buffer layers, texture, thickness dependence, RABITS process, substrate Hastelloy, substrate Ni-W, X-ray diffraction, microstructure, resistive transition, magnetic field dependence, critical caracteristics, Jc/B curves, critical temperature, upper critical fields
Grasso G., Ferdeghini C., Siri A.S., Hopkins S.C., Putti M., Vignolo M., Morawski A., Bernini C., Ballarino A., Tropeano M., Gajda D., Cetner T., Bovone G., Capra M., Loria F.
Malagoli A., Ferdeghini C., Vannozzi A., Celentano G., Hopkins S.C., Braccini V., Putti M., Ballarino A., Bellingeri E., Sylva G., Lunt A.
Ключевые слова: FeSeTe, coated conductors, substrate metallic, texture, X-ray diffraction, microstructure, composition, distribution, fabrication, experimental results
Ferdeghini C., Braccini V., Putti M., Ghigo G., Gozzelino L., Pallecchi I., Pace S., Grimaldi G., Leo A., Nigro A., Martinelli A., Bellingeri E., Torsello D., Sylva G., Pellegrino L.
Malagoli A., Ferdeghini C., Chiarelli S., Celentano G., Hopkins S.C., Putti M., Ballarino A., Leveratto A., Leoncino L.
Ключевые слова: HTS, Bi2212, wires multifilamentary, fabrication, mechanical treatment, measurement technique, critical caracteristics, Jc/B curves, length, homogeneity
Ferdeghini C., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Augieri A., Bellingeri E., Sylva G.
Ключевые слова: chalcogenide, FeSeTe, coated conductors, RABITS process, template layers, fabrication, substrate Ni-W, X-ray diffraction, PLD process, microstructure, buffer layers, texture, resistivity, temperature dependence, magnetic field dependence, upper critical fields, irreversibility fields, critical caracteristics, Jc/B curves, pinning force
Ключевые слова: PIT process, fabrication, anisotropy, pinning force, MRI magnets, pnictides, resistance, temperature dependence, phase diagram, doping effect, chalcogenide, presentation, MgB2, upper critical fields, doping effect, critical temperature, thin films, critical caracteristics, Jc/B curves, temperature dependence, angular dependence, microstructure, grain boundaries
Ключевые слова: pnictides, comparison, LTS, HTS, MgB2, NbTi, Nb3Sn, Bi2223, Bi2212, REBCO, coated conductors, wires, tapes, critical temperature, magnetic field density, temperature dependence, Jc/B curves, critical current density, magnetic field dependence, review
Ferdeghini C., Holzapfel B., Braccini V., Tarantini C., Putti M., Sarnelli E., Reich E., Bellingeri E., Sala A., Kawale S., Buzio R., Gerbi A., Adamo M.
Ключевые слова: chalcogenide, thin films, PLD process, substrate LaAlO3, substrate SrTiO3, substrate single crystal, substrates, critical temperature, fabrication, microstructure, lattice parameter, critical caracteristics, Jc/B curves, anisotropy, comparison, YBCO, grain boundaries, resistive transition, magnetic field dependence, upper critical fields, high field magnets
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